Wafer 2D AOI
Category: Smart Factory
Exhibitor: GALLANT PRECISION MACHINING CO., LTD.
Booth No: I628
Characteristic
Meeting the defect inspection requirements before and after wafer dicing in advanced packaging processes
Guided user interface with real-time simulation and inspection functionality
AI-based automatic defect detection and classification
Other Products
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Parts/Material AMR
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EPM AMR
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Glass Wafer/ Bare Wafer AOI
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Auto Scan White Light Interferometer
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3D NIR
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Strip Grinder
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GPM SI Solution
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